A method of storing parameters and importance data using nonvolatile memory in test instrument to avoid lose in RAM caused by power-down are proposed.
A method of storing parameters and importance data using nonvolatile memory in test instrument to avoid lose in RAM caused by power-down are proposed.
摘要针对在使用RAM保存数据由掉电带来的数据丢失问题，提出了一种利用非易失性存储器存储测试仪器参数和重要数据的方法。