The experimental results show that the surface Si-OH bonds infrared intensity of ultrafine silicon dioxide was decreased and thermogravimetric loss was increased by using Fourier infrared (FTIR) spectroscopy and thermogravimetric (TG) analyzer.
The experimental results show that the surface Si-OH bonds infrared intensity of ultrafine silicon dioxide was decreased and thermogravimetric loss was increased by using Fourier infrared (FTIR) spectroscopy and thermogravimetric (TG) analyzer.
傅立叶红外光谱和热重分析结果表明，改性后的超细二氧化硅颗粒表面的硅羟基吸收峰明显减小。