Not only the scan route solution, the built-in self-test solution and the boundary scan solution of design for testability are summarized, but also the applications and countermeasures of these 3 solutions are analysed and compared in details.
Not only the scan route solution, the built-in self-test solution and the boundary scan solution of design for testability are summarized, but also the applications and countermeasures of these 3 solutions are analysed and compared in details.
摘要综述了超大规模集成电路的几种主要的可测试性设计技术，如扫描路径法、内建自测试法和边界扫描法等，并分析比较了这几种设计技术各自的特点及其应用方法和策略。