This phenomenon is attributed to the increase of carrier capture time arising from the potential barrier lowering (Frenkel Poole effect) and the field enhanced thermal ionization.
This phenomenon is attributed to the increase of carrier capture time arising from the potential barrier lowering (Frenkel Poole effect) and the field enhanced thermal ionization.
这是由于随着外加电场增加 ,Frenkel Poole效应导致的EL缺陷中心库仑吸引势垒降低和电场增强的碰撞电离效应显著增强 ,导致载流子俘获截面减小 ,载流子寿命增加之故