例句 /

Lin H, Li L and Zeng L., In-situ end-point detection during ion-beam etching of multilayer dielectric gratings, Chin. Opt. Lett. , 3 (2), 63 (2005).

Lin H, Li L and Zeng L., In-situ end-point detection during ion-beam etching of multilayer dielectric gratings, Chin. Opt. Lett. , 3 (2), 63 (2005).

林华,介质膜光栅:光刻胶掩模占宽比和离子束刻蚀槽深的监控,博士论文,导师:李立峰(2006).