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Chi-Jie Lu, Du-Ming Tsai and Hsu-Nan Yen, (2002) Automatic Defect Inspection for LCDs Using Singular Value Decomposition,” The Fourth Asia-pacific conference on Industrial Engineering and Management Systems, Taipei, Taiwan, December 18-22.
吕奇杰、蔡东升、陈乃魁、洪嘉佑、程希钧(2004)“应用支援向量机于信用卡分类模式之建构”第三届资讯与管理应用研讨会，元培技术学院，新竹。