Analysis th to mechanism ellipse polarized light that in the specimen faced happen at the same time reflection refraction and multiplicity light beam interference, proves the principle that laser instrument of measure thickness of specimen with Jones Vect
Analysis th to mechanism ellipse polarized light that in the specimen faced happen at the same time reflection refraction and multiplicity light beam interference, proves the principle that laser instrument of measure thickness of specimen with Jones Vect
摘要对椭圆偏振光在样品表面产生的反射、折射和多光束干涉的机制进行了分析，并用琼斯矢量论证了激光测厚仪的原理。