The prepared SiO2 sols, polyelectrolyte/SiO2 composite films and SiO2 thin films are investigated with transmission electron microscope, fourier transform infrared spectrophotometer and 721 spectrophotometer.
The prepared SiO2 sols, polyelectrolyte/SiO2 composite films and SiO2 thin films are investigated with transmission electron microscope, fourier transform infrared spectrophotometer and 721 spectrophotometer.
采用透射电镜、红外光谱仪、721分光光度计对二氧化矽溶胶和薄膜进行了分析。